• Defect Spectroscopy

         Photo-induced transient spectroscopy (PITS)
         
         
         
         
         
         
         
  • Photo-induced transient spectroscopy (PITS)

    This technique is useful to identify defect/trap levels in the bandgap. In this technique, the sample is excited with a chopped light. The differantial photocurrent, sampled between t 1 and t 2 decay times, is recorded using a lock-in amplifier connected to the multivibrator/gate/sample and a hold circuit. Using the photocurrent decay curves of the PITS signal at some determined t 1 and t 2 decay times, activation energies and capture cross-sections of the defects/traps can be calculated.